Webb飞行时间二次离子质谱仪(TOF-SIMS) 设备型号: PHI nano TOF Ⅱ. 技术参数: 1)低质量时质量分辨率:m/z = 28 (Si+)和29 (SiH+) 的m/∆m ≥ 12,000. 2)高质量时质量分辨 … http://www.phi-nano.com/%D9%85%D9%86%D8%AD-%D8%AF%D8%B1%D8%A7%D8%B3%D9%8A%D8%A9/
PHI nanoTOF II TOF-SIMS Surface Analysis Instrument
Webb26 nov. 2024 · ToF-SIMS measurements were conducted with a PHI nano ToF II (ULVAC- PHI Inc., Chigasaki, Kanagawa, Japan), where a 30 kV Bi+pulsed primary ion beam was … graphics new orleans
(PDF) Component distribution of nano-carbon materials
Webb1 sep. 2011 · Significance and Impact of the Study: This work demonstrates, for the first time, that artificial saliva was a convenient medium that permitted Strep. salivarius to grow in oral conditions (physico‐chemical environment, addition of meals) but not to maintain cellular viability and vitality in starvation conditions. Webbdepth is 242.5 nm as shown in Figure 1(ii) and total sputtering duration is 820 s. ToF-SIMS data acquisition To measure the secondary ion counts, the PHI nano ToF II TRIFT was used from Physical Electronics, MN, USA. In this process, a 10 ns pulsed liquid metal ion gun (LMIG) uses Gallium (Ga+) sources to produce ions as primary ion Webb12 nov. 2024 · Efficient one-pot synthesis of new series of furylpyrazolino[60]fullerene derivatives was prepared by [3 + 2] cycloaddition reaction mediated with (diacetoxyiodo)benzene (PhI(OAc)2) as an oxidant in o-dichlorobenzene (ODCB) under microwave irradiation. Different techniques have been used to confirm the structural … graphics new ulm mn